Universal density scaling of disorder-limited low-temperature conductivity in high-mobility two-dimensional systems
S. Das Sarma, E. H. Hwang

TL;DR
This paper develops a theoretical framework for understanding how low-temperature conductivity in high-mobility 2D electronic systems scales with carrier density, revealing a non-monotonic density dependence of the scaling exponent influenced by disorder type.
Contribution
The study introduces a universal density scaling law for 2D conductivity considering Coulomb disorder, predicting a maximum scaling exponent and providing a method to characterize disorder nature.
Findings
The conductivity scales as (n) n^{eta(n)} with a non-monotonic (n).
Maximum conductivity exponent (or 2.7) occurs around k_F d 1.
Remote Coulomb impurities can lead to scaling, exceeding naive theoretical limits.
Abstract
We theoretically consider the carrier density dependence of low-temperature electrical conductivity in high-quality and low-disorder two-dimensional (2D) `metallic' electronic systems such as 2D GaAs electron or hole quantum wells or gated graphene. Taking into account resistive scattering by Coulomb disorder arising from quenched random charged impurities in the environment, we show that the 2D conductivity \sigma(n) varies as \sigma ~ n^{\beta(n)} as a function of the 2D carrier density n where the exponent \beta(n) is a smooth, but non-monotonic, function of density with possible nontrivial extrema. In particular, the density scaling exponent \beta(n) depends qualitatively on whether the Coulomb disorder arises primarily from remote or background charged impurities or short-range disorder, and can, in principle, be used to characterize the nature of the dominant background disorder.…
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