Improved superconducting qubit coherence using titanium nitride
J. Chang, M. R. Vissers, A. D. Corcoles, M. Sandberg, J. Gao, David W., Abraham, Jerry M. Chow, Jay M. Gambetta, M. B. Rothwell, G. A. Keefe,, Matthias Steffen, and D. P. Pappas

TL;DR
This paper reports a significant enhancement in superconducting qubit coherence times by using titanium nitride for capacitors, indicating surface losses from TLS defects as a key limiting factor.
Contribution
It introduces TiN-fabricated capacitors for transmon qubits, achieving up to six times longer coherence times and providing evidence of surface loss limitations.
Findings
Up to ~60 μs relaxation and dephasing times achieved
Six-fold improvement over previous aluminum-based qubits
Anomalous temperature-dependent frequency shift observed in TiN resonators
Abstract
We demonstrate enhanced relaxation and dephasing times of transmon qubits, up to ~ 60 \mu s by fabricating the interdigitated shunting capacitors using titanium nitride (TiN). Compared to lift-off aluminum deposited simultaneously with the Josephson junction, this represents as much as a six-fold improvement and provides evidence that previous planar transmon coherence times are limited by surface losses from two-level system (TLS) defects residing at or near interfaces. Concurrently, we observe an anomalous temperature dependent frequency shift of TiN resonators which is inconsistent with the predicted TLS model.
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