Performance tests of an AGIPD 0.4 assembly at the beamline P10 of PETRA III

TL;DR

This paper reports on the performance testing of an AGIPD 0.4 detector assembly at PETRA III, demonstrating its high dynamic range, ability to image single photons, and capability to observe microsecond-scale dynamics for XFEL applications.

Contribution

First testing of an AGIPD 0.4 assembly at a synchrotron beamline, validating its imaging performance and dynamic range for XFEL experiments.

Findings

Successfully imaged direct beam and single photons simultaneously

Demonstrated large dynamic range suitable for XFEL

Observed microsecond-scale dynamics in test samples

Abstract

The Adaptive Gain Integrating Pixel Detector (AGIPD) is a novel detector system, currently under development by a collaboration of DESY, the Paul Scherrer Institute in Switzerland, the University of Hamburg and the University of Bonn, and is primarily designed for use at the European XFEL. To verify key features of this detector, an AGIPD 0.4 test chip assembly was tested at the P10 beamline of the PETRA III synchrotron at DESY. The test chip successfully imaged both the direct synchrotron beam and single 7.05 keV photons at the same time, demonstrating the large dynamic range required for XFEL experiments. X-ray scattering measurements from a test sample agree with standard measurements and show the chip's capability of observing dynamics at the microsecond time scale.