Simultaneous quantitative imaging of surface and magnetic forces

TL;DR

This paper presents a method for simultaneous quantitative imaging of magnetic and surface forces at the nanoscale using intermodulation atomic force microscopy, enabling detailed force mapping in different interaction regimes.

Contribution

It introduces a technique to distinguish and quantify magnetic and surface forces simultaneously, advancing nanoscale force measurement capabilities.

Findings

Magnetic forces of 200 pN are separated from surface forces of 30 nN.

Imaging performed in both contact and non-contact regimes.

Demonstrates simultaneous force imaging with high sensitivity.

Abstract

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging of these forces is performed in both the contact and non-contact regimes of near-surface interactions.