X-ray reflected spectra from accretion disk models. III. A complete grid of ionized reflection calculations

TL;DR

This paper introduces a comprehensive library of synthetic X-ray reflection spectra from accretion disks, covering a wide parameter space, to improve modeling of black hole and active galactic nuclei observations.

Contribution

The authors present an updated, extensive grid of ionized reflection models using the XILLVER code, incorporating new routines and atomic data for better accuracy.

Findings

Provides 720 reflection spectra in a single FITS file for X-ray analysis.

Covers a broad parameter space relevant to AGN and black hole states.

Demonstrates improvements over previous reflection models.

Abstract

We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code XILLVER that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index \Gamma of the illuminating radiation, the ionization parameter \xi at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A_{Fe} relative to the solar value. The ranges of the parameters covered are: 1.2 \leq \Gamma \leq 3.4, 1 \leq \xi \leq 10^4, and 0.5 \leq A_{Fe} \leq 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file{\url{http://hea-www.cfa.harvard.edu/~javier/xillver/}} suitable for the analysis of X-ray observations via the atable model in XSPEC. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of XILLVER.