Optical identification of crystal defects in CCD matrix

TL;DR

This paper introduces a simple optical method for identifying crystal defects in CCD matrices that distinguishes between point defects and dislocations based on dark current behavior, without requiring expensive equipment.

Contribution

The paper presents a novel, cost-effective optical technique for classifying CCD defects into point and spatial types based on dark current analysis.

Findings

Defects influence dark current generation during light gathering.

The method effectively classifies defects without special equipment.

Experimental validation confirms the defect behavior differences.

Abstract

An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two groups: the point defects and the spatial defects (dislocations). During the experiments it was proven that the type of defect affects the behaviour of the dark current generation during the light gathering .