Finite-size effect in shot noise in hopping conduction

TL;DR

This paper investigates shot noise in a 2D GaAs insulator in the variable range hopping regime, revealing finite-size effects and enabling precise quasiparticle charge measurements in the insulating state.

Contribution

It demonstrates the observation of finite-size effects in shot noise within VRH conduction, advancing understanding of noise behavior in insulating systems.

Findings

Shot noise approaches Poissonian value at low temperature

Finite-size effects influence shot noise in VRH conduction

Potential for accurate quasiparticle charge measurements in insulators

Abstract

We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime.