Combined evanescent-wave excitation and supercritical-angle fluorescence detection improves optical sectioning
Maia Brunstein, Maxime Teremetz, Christophe Tourain, Martin Oheim

TL;DR
This paper combines evanescent-wave excitation with supercritical-angle fluorescence detection to enhance optical sectioning in microscopy, addressing background fluorescence issues and enabling more precise imaging near cell membranes.
Contribution
It introduces a microscopy method that merges TIRF excitation with SAF detection, improving axial resolution and quantitative imaging near surfaces.
Findings
Stray light from optics is a major background source.
SAF detection effectively rejects deeper fluorescence.
The method enables better imaging of membrane-proximal fluorophores.
Abstract
Evanescent-wave microscopy achieves sub-diffraction axial sectioning by confining fluorescence excitation to a thin layer close to the cell/substrate interface. How thin this light sheet exactly is, however, is often unknown. Particularly in the popular objective-type total internal reflection fluorescence microscopy (TIRFM) configuration large deviations from the expected exponential intensity decay of the evanescent wave have been reported. Propagating, i.e., non-evanescent, excitation light diminishes the optical sectioning effect, reduces contrast and renders the quantification of TIRFM images uncertain. Here, we use a combination of azimuthal- and polar-angle beam scanning, dark-field scatter imaging, and atomic force microscopy to identify the sources of this unwanted background fluorescence excitation. We identify stray light originating from the microscope optics and the…
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Taxonomy
TopicsAdvanced Fluorescence Microscopy Techniques · Optical Coherence Tomography Applications · Near-Field Optical Microscopy
