Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic

TL;DR

This study investigates how thermal noise impacts the reliability of stress-induced switching in dipole-coupled multiferroic nanomagnets, revealing factors that influence switching probability and error rates at room temperature.

Contribution

It provides a numerical analysis of the effects of thermal noise on nanomagnetic switching, highlighting challenges for practical nanomagnetic logic implementations.

Findings

Thermal broadening causes high switching error rates.

Dipole coupling strength, stress levels, and ramp rates significantly affect switching reliability.

Thermal noise may limit the practicality of nanomagnetic logic schemes.

Abstract

The stress-induced switching behavior of a multiferroic nanomagnet, dipole coupled to a hard nanomagnet, is numerically studied by solving the stochastic Landau-Lifshitz-Gilbert (LLG) equation for a single domain macro-spin state. Different factors were found to affect the switching probability in the presence of thermal noise at room temperature: (i) dipole coupling strength, (ii) stress levels, and (iii) stress withdrawal rates (ramp rates). We report that the thermal broadening of the magnetization distribution causes large switching error rates. This could render nanomagnetic logic schemes that rely on dipole coupling to perform Boolean logic operations impractical whether they are clocked by stress or field or other means.