Detecting swift heavy ion irradiation effects with graphene

TL;DR

This study demonstrates that single-layer graphene can effectively detect and analyze swift heavy ion irradiation effects on various substrates, providing a simple and local method for assessing irradiation success and impact.

Contribution

The paper introduces a novel application of graphene as a tool for detecting and characterizing swift heavy ion modifications on different materials.

Findings

Graphene can verify successful irradiation.

Graphene determines ion fluence.

Graphene captures material ejected during irradiation.

Abstract

In this paper we show how single layer graphene can be utilized to study swift heavy ion (SHI) modifications on various substrates. The samples were prepared by mechanical exfoliation of bulk graphite onto SrTiO$_3$, NaCl and Si(111), respectively. SHI irradiations were performed under glancing angles of incidence and the samples were analysed by means of atomic force microscopy in ambient conditions. We show that graphene can be used to check whether the irradiation was successful or not, to determine the nominal ion fluence and to locally mark SHI impacts. In case of samples prepared in situ, graphene is shown to be able to catch material which would otherwise escape from the surface.