Two Single-shot Methods for Locating Multiple Electromagnetic Scatterers
Jingzhi Li, Hongyu Liu, Zaijiu Shang, Hongpeng Sun

TL;DR
This paper introduces two efficient, noise-robust inverse scattering methods for locating multiple electromagnetic scatterers using a single far-field measurement, applicable to various obstacle sizes and types.
Contribution
The paper presents two novel single-shot schemes for electromagnetic scatterer localization, accommodating unknown numbers and types of obstacles with rigorous mathematical validation.
Findings
Effective localization of small and regular-sized scatterers
Methods are robust to noise and do not require inversion
Numerical experiments confirm accuracy and efficiency
Abstract
We develop two inverse scattering schemes for locating multiple electromagnetic (EM) scatterers by the electric far-field measurement corresponding to a single incident/detecting plane wave. The first scheme is for locating scatterers of small size compared to the wavelength of the detecting plane wave. The multiple scatterers could be extremely general with an unknown number of components, and each scatterer component could be either an impenetrable perfectly conducting obstacle or a penetrable inhomogeneous medium with an unknown content. The second scheme is for locating multiple perfectly conducting obstacles of regular size compared to the detecting EM wavelength. The number of the obstacle components is not required to be known in advance, but the shape of each component must be from a certain known admissible class. The admissible class may consist of multiple different reference…
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Taxonomy
TopicsNumerical methods in inverse problems · Microwave Imaging and Scattering Analysis · Geophysical Methods and Applications
