Enhanced Spin and Electronic Reconstructions at the Cuprate-Manganite Interface

TL;DR

This study uses resonant soft X-ray spectroscopy to reveal significant enhancements in magnetic and electronic properties at the cuprate-manganite interface, indicating profound orbital reconstructions and charge transfer effects.

Contribution

It demonstrates unprecedented increases in dichroic signals and interlayer charge transfer at the interface, linked to growth conditions, advancing understanding of interfacial phenomena in complex oxides.

Findings

Up to five-fold increase in dichroic signal at Cu L edge.

Charge transfer up to 0.25e per copper ion observed.

Enhanced TMI in manganite layers with rapid flux modulation.

Abstract

We report on a resonant soft X-ray spectroscopy study of the electronic and magnetic structure of the cuprate-manganite interface. Polarized X-ray spectroscopy measurements taken at the Cu L edge reveal up to a five-fold increase in the dichroic signal as compared to past experimental and theoretical values. Furthermore an increase in the degree of interlayer charge transfer up to 0.25e (where e is charge of an electron) per copper ion is observed leading to a profound reconstruction in the orbital scheme for these interfacial copper ions. It is inferred that these enhancement are related to an increase in TMI observed for manganite layers grown with rapidly modulated flux.