Ultrafast x-ray diffraction studies of photoexcited coherent phonons in SrRuO$_3$ thin films

TL;DR

This study uses ultrafast x-ray diffraction to observe how photoexcited SrRuO$_3$ thin films generate and propagate coherent phonons, revealing universal strain dynamics influenced by rapid electron-phonon relaxation.

Contribution

It demonstrates the generation of coherent phonons in SrRuO$_3$ thin films and provides a detailed analysis of their universal strain evolution, supported by numerical simulations.

Findings

Transient splitting of Bragg peaks indicates acoustic strain waves.

Fast electron-phonon relaxation causes quasi-instantaneous thermal stress.

Universal strain evolution observed across different film thicknesses.

Abstract

We present ultrafast x-ray diffraction experiments on thin films of metallic SrRuO$_3$ (SRO) after their excitation with ultrashort intense laser pulses. Depending on the layer thickness, the data exhibit a transient splitting of the (002) SRO Bragg peak evidencing the generation and propagation of sharp acoustic strain waves. These distinct structural dynamics are due to the exceptionally fast electron-phonon relaxation that gives rise to a quasi-instantaneous thermal stress in SRO. The interpretation is corroborated by numerical simulations which show excellent agreement with the experimental findings. Despite the qualitatively different lattice dynamics for different SRO layer thicknesses, we identify a universal evolution of the transient average layer strain. The inferred discrepancy of the thermal stress profile from the excitation profile may hint toward a temperature-dependent effective Gr\"uneisen parameter of SRO.