Characterization of scatterers for an active focal plane Compton polarimeter
Sergio Fabiani, Riccardo Campana, Enrico Costa, Ettore Del Monte,, Fabio Muleri, Alda Rubini, Paolo Soffitta

TL;DR
This paper presents the first experimental characterization of an active Compton polarimeter for hard X-ray polarimetry, demonstrating its feasibility and sensitivity with a low energy threshold and potential for astrophysical observations.
Contribution
It provides experimental measurements of tagging efficiency and evaluates the sensitivity of a novel polarimeter design for hard X-ray polarimetry.
Findings
Demonstrated feasibility of polarimetry with a 20 keV threshold.
Estimated a 10% Minimum Detectable Polarization for a 10 mCrab source.
Characterized scattering materials for polarimeter sensitivity.
Abstract
In this work we present an active Compton scattering polarimeter as a focal plane instrument able to extend the X-ray polarimetry towards hard X-rays. Other authors have already studied various instrument design by means of Monte Carlo simulations, in this work we will show for the first time the experimental measurements of "tagging efficiency" aimed to evaluate the polarimeter sensitivity as a function of energy. We performed a characterization of different scattering materials by measuring the tagging efficiency that was used as an input to the Monte Carlo simulation. Then we calculated the sensitivity to polarization of a design based on the laboratory set-up. Despite the geometry tested is not optimized for a realistic focal plane instrument, we demonstrated the feasibility of polarimetry with a low energy threshold of 20 keV. Moreover we evaluated a Minimum Detectable Polarization…
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