Ba(Zn1/3Nb2/3)O3 thin films obtained by polymeric precursors method

Jo\~ao Elias Figueiredo Soares Rodrigues; D\'ebora Morais Bezerra,; Adeilton Pereira Maciel; Alexandre Rocha Paschoal; Carlos William de Araujo; Paschoal

arXiv:1212.2272·cond-mat.mtrl-sci·December 12, 2012·1 cites

Ba(Zn1/3Nb2/3)O3 thin films obtained by polymeric precursors method

Jo\~ao Elias Figueiredo Soares Rodrigues, D\'ebora Morais Bezerra,, Adeilton Pereira Maciel, Alexandre Rocha Paschoal, Carlos William de Araujo, Paschoal

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TL;DR

This paper reports the synthesis and characterization of high-quality Ba(Zn1/3Nb2/3)O3 thin films using the polymeric precursors method, highlighting their structural and morphological properties.

Contribution

It introduces a detailed polymeric precursors approach for fabricating Ba(Zn1/3Nb2/3)O3 thin films with confirmed partial order and specific structural features.

Findings

01

Films are polycrystalline with a partial ordered trigonal structure.

02

Raman measurements confirm the partial order and structure.

03

Morphology characterized by confocal Raman and atomic force microscopy.

Abstract

In this work Ba(Zn1/3Nb2/3)O3_3 $t hin f i l m s w er e p r e p a r e d b y t h e p o l y m er i c p r ec u r sor s m e t h o d . A d e t ai l e dd escr i pt i o n o f t h e p r oce d u r e t oo b t ain t h e p r ec u r sor s an dd e p os i t i o n w a s p r ese n t e d . H i g h q u a l i t y p o l y cr y s t a l l in e f i l m so f B a (Z n 1/3 N b 2/3) O 3 w er eo b t ain e df r o m P t / T i / S i O$ _2$/Si substrate deposited by spin coating technique. X ray measurements show that the film crystallizes in a partial ordered trigonal structure characteristic of the 1:2 complex perovskites. The partial order and structure was confirmed by Raman measurements. Also, confocal Raman and atomic force microscopy was used to characterize the film morphology.

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Taxonomy

TopicsMicrowave Dielectric Ceramics Synthesis · Ferroelectric and Piezoelectric Materials · Advanced ceramic materials synthesis