Scaling of gamma-spectra registered by semiconductor detectors
E. G. Obrazovskii
TL;DR
This paper investigates how gamma-spectra recorded by semiconductor detectors scale and proposes a simulation method for multicomponent spectra based on a single experimental spectrum.
Contribution
It introduces a new method for simulating multicomponent gamma spectra using only one experimental spectrum, enhancing practical analysis.
Findings
Scaling properties of gamma spectra are characterized.
A simulation method for multicomponent spectra is proposed.
The method simplifies spectrum analysis in practical scenarios.
Abstract
Scaling properties of gamma-spectra recorded by semiconductor detectors are investigated. For practical purposes the method of simulation multicomponent spectra using single experimental spectrum are suggested.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsRadiation Detection and Scintillator Technologies · Advanced Semiconductor Detectors and Materials · Calibration and Measurement Techniques