Oversampling smoothness (OSS): an effective algorithm for phase retrieval of noisy diffraction intensities
Jose A Rodriguez, Rui Xu, Chien-Chun Chen, Yunfei Zou, Jianwei Miao

TL;DR
The paper introduces OSS, an iterative algorithm that improves phase retrieval from noisy diffraction data by leveraging pixel correlation and spatial frequency filtering, outperforming existing methods in accuracy and consistency.
Contribution
The paper presents OSS, a novel phase retrieval algorithm that effectively handles noise by combining smoothness constraints with existing iterative methods.
Findings
OSS outperforms HIO, ER-HIO, and NR-HIO algorithms in noisy conditions.
Numerical simulations and biological data validate OSS's superior accuracy.
OSS maintains robustness across various noise levels.
Abstract
Coherent diffraction imaging (CDI) is high-resolution lensless microscopy that has been applied to image a wide range of specimens using synchrotron radiation, X-ray free electron lasers, high harmonic generation, soft X-ray laser and electrons. Despite these rapid advances, it remains a challenge to reconstruct fine features in weakly scattering objects such as biological specimens from noisy data. Here we present an effective iterative algorithm, termed oversampling smoothness (OSS), for phase retrieval of noisy diffraction intensities. OSS exploits the correlation information among the pixels or voxels in the region outside of a support in real space. By properly applying spatial frequency filters to the pixels or voxels outside the support at different stage of the iterative process (i.e. a smoothness constraint), OSS finds a balance between the hybrid input-output (HIO) and error…
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