Scattering by linear defects in graphene: a tight-binding approach

TL;DR

This paper presents an analytical formalism based on tight-binding models to compute electron transmittance through various periodic defect lines in graphene, simplifying the process to matrix operations.

Contribution

It introduces a straightforward tight-binding approach for analyzing scattering by complex defect lines in graphene, applicable to both simple and intricate defect structures.

Findings

Formalism applied to pentagon-only defect line

Extended to zz(558) and zz(5757) defect lines

Method simplifies calculations to matrix manipulations

Abstract

We develop an analytical scattering formalism for computing the transmittance through periodic defect lines within the tight-binding model of graphene. We first illustrate the method with a relatively simple case, the pentagon-only defect line. Afterwards, more complex defect lines are treated, namely the zz(558) and the zz(5757) ones. The formalism developed, only uses simple tight-binding concepts, reducing the problem to matrix manipulations which can be easily worked out by any computational algebraic calculator.