Thomson backscattering diagnostics of nanosecond electron bunches in high space charge regime
B. Paroli

TL;DR
This paper proposes a Thomson backscattering diagnostic method for measuring density, energy, and spread of nanosecond electron bunches in high space charge regimes, using a setup optimized for sensitivity and resolution.
Contribution
It introduces a novel laser-based diagnostic setup for high-brightness electron bunches in high space charge conditions, with detailed configurations and sensitivity analysis.
Findings
Successful characterization of electron bunches with <4ns pulse duration
Optimized laser-electron interaction geometry for improved sensitivity
Estimated minimum detection sensitivity of the diagnostic system
Abstract
The intra-beam repulsions play a significant role in determining the performances of free-electron devices when an high brilliance of the beam is required. The transversal and longitudinal spread of the beam, its energy and density are fundamental parameters in any beam experiment and different beam diagnostics are available to measure such parameters. A diagnostic method based on the Thomson backscattering of a laser beam impinging on the particle beam is proposed in this work for the study of nanosecond electron bunches in high space charge regime. This diagnostics, aimed to the measurement of density, energy and energy spread, was set-up in a Malmberg-Penning trap (generally used for the electron/ion confinment) in two different configurations designed to optimize sensitivity, spatial resolution and electron-beam coincidence in space and time. To this purpose an electron bunch (pulse…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsLaser-Plasma Interactions and Diagnostics · Laser-induced spectroscopy and plasma · Electron and X-Ray Spectroscopy Techniques
