Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV

TL;DR

This paper demonstrates a novel multi-crystal optical arrangement that significantly enhances angular dispersion rates, enabling hard x-ray spectrographs with record high energy resolution of approximately 90 micro-eV, advancing ultra-high-resolution x-ray spectroscopy.

Contribution

The paper introduces a multi-crystal, multi-Bragg-reflection design that achieves nearly two orders of magnitude higher dispersion rates for hard x-ray spectrographs compared to single reflections.

Findings

Achieved a spectral resolution of approximately 90 micro-eV in hard x-ray spectroscopy.

Demonstrated that multi-crystal arrangements can serve as effective dispersing elements.

Enabled potential improvements in ultra-high-resolution x-ray spectroscopic techniques.

Abstract

Spectrographs take snapshots of photon spectra with array detectors by dispersing photons of different energies into distinct directions and spacial locations. Spectrographs require optics with a large angular dispersion rate as the key component. In visible light optics diffraction gratings are used for this purpose. In the hard x-ray regime, achieving large dispersion rates is a challenge. Here we show that multi-crystal, multi-Bragg-reflection arrangements feature cumulative angular dispersion rates almost two orders of magnitude larger than those attainable with a single Bragg reflection. As a result, the multi-crystal arrangements become potential dispersing elements of hard x-ray spectrographs. The hard x-ray spectrograph principles are demonstrated by imaging a spectrum of photons with a record high resolution of $\Delta E \simeq 90 \mu$eV in hard x-ray regime, using multi-crystal optics as dispersing element. The spectrographs can boost research using inelastic ultra-high-resolution x-ray spectroscopies with synchrotrons and seeded XFELs.