Loss tangent measurements of dielectric substrates from 15 K to 300 K with two resonators: investigation into accuracy issues

TL;DR

This study evaluates the accuracy of loss tangent measurements of various dielectric substrates across 15 K to 300 K using two resonator types, highlighting potential issues and verification methods for precise characterization.

Contribution

It introduces a comparative analysis of measurement accuracy for dielectric substrates using two resonator configurations over a wide temperature range.

Findings

Measurement accuracy varies between resonator types.

Verification methods improve reliability of loss tangent data.

Temperature affects dielectric loss measurements significantly.

Abstract

The loss tangent of medium, low and very low loss dielectric substrates (including the Rogers RT Duroid 5880 and 6010.2, LaAlO3, (La, Sr)(Al, Ta)O3, MgO and Quartz) was measured at varying temperatures with two TE01{\delta} dielectric resonators to ensure verification of the tests. The accuracy of the measurements has been researched and discussed for split post dielectric resonator (SPDR) in a copper enclosure and a single post dielectric resonator (SuPDR) in a superconducting enclosure in the temperature range from 15K to 300 K.