A new method to correct deformations in emulsion using a precise photomask
M. Kimura, H. Ishida, H. Shibuya, S. Ogawa, T. Matsuo, C. Fukushima,, G. Takahashi, K. Kuge, Y. Sato, I. Tezuka, S. Mikado

TL;DR
This paper introduces a novel correction method for emulsion deformations using a precise photomask, significantly improving positional accuracy in nuclear emulsion tracking for experiments with limited reference tracks.
Contribution
The paper presents a new correction technique employing a precise photomask to recover high accuracy in emulsion tracking, especially useful with few reference tracks.
Findings
Achieved 0.6 μm position measurement accuracy over 5 cm x 7 cm area.
Enabled submicron accuracy in track segment measurements with minimal reference tracks.
Applicable to underground hybrid emulsion experiments with limited reference data.
Abstract
A new method to correct the emulsion deformation, mainly produced in the development process, is developed to recover the high accuracy of nuclear emulsion as a tracking device. The method is based on a precise photomask and a careful treatment of the emulsion films. A position measurement accuracy of 0.6 {\mu}m is obtained over an area of 5 cm x 7 cm. The method allows to measure positions of track segments with submicron accuracy in an ECC brick with as few as 10 reference tracks for alignment. Such a performance can be important for hybrid emulsion experiments at underground laboratories where only a small number of reference tracks for alignment are available.
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