Operational use of ionization profile monitors in the Fermilab Main Injector

TL;DR

This paper discusses the operational application of ionization profile monitors at Fermilab's Main Injector, highlighting their role in non-destructive beam diagnostics and future plans for enhanced beam monitoring.

Contribution

It provides an overview of how IPMs are used for emittance and lattice matching measurements, emphasizing their importance in Fermilab's current and future accelerator operations.

Findings

IPMs enable turn-by-turn emittance measurements without beam interception.

They are crucial for injection lattice matching and beam diagnostics.

Future plans include expanding IPM applications for high-intensity beam monitoring.

Abstract

Ionization profile monitors (IPMs) are used in the Fermilab Main Injector (MI) to monitor injection lattice matching by measuring turn-by-turn sigmas at injection and to measure transverse emittance of the beam during the acceleration cycle. The IPMs provide a periodic, non-destructive means of performing turn-by-turn emittance measurements where other techniques are not applicable. As Fermilab is refocusing its attention on the intensity frontier, non-intercepting diagnostics such as IPMs are expected to become even more important. This paper gives an overview of the operational use of IPMs for emittance measurements and injection lattice matching measurements at Fermilab, and summarizes the future plans.