Increased surface flashover voltage in microfabricated devices
R. C. Sterling, M. D. Hughes, C. J. Mellor, W. K. Hensinger

TL;DR
This paper demonstrates a fabrication process modification that more than doubles the surface flashover voltage in microfabricated devices, enabling higher electric fields for advanced applications.
Contribution
It introduces a novel fabrication technique that significantly increases surface flashover voltage in microdevices, facilitating improved performance in quantum and nano-fabricated systems.
Findings
Flashover voltage more than doubled through fabrication modifications
Enhanced device performance in vacuum environments
Implications for scalable ion trap quantum technology
Abstract
With the demand for improved performance in microfabricated devices, the necessity to apply greater electric fields and voltages becomes evident. When operating in vacuum, the voltage is typically limited by surface flashover forming along the surface of a dielectric. By modifying the fabrication process we have discovered it is possible to more than double the flashover voltage. Our finding has significant impact on the realization of next-generation micro- and nano-fabricated devices and for the fabrication of on-chip ion trap arrays for the realization of scalable ion quantum technology.
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