Optical properties and hardness of highly a-axis oriented AlN films
Feby Jose, R. Ramaseshan, S. Tripura Sundari, S. Dash, M. S. R. N., Kiran, A. K. Tyagi, and U. Ramamurty

TL;DR
This study investigates the optical and nanomechanical properties of highly a-axis oriented AlN thin films, revealing their potential for protective coatings and piezoelectric applications due to their superior hardness and elastic modulus.
Contribution
First detailed characterization of highly a-axis oriented AlN films' optical and mechanical properties using reactive DC magnetron sputtering.
Findings
Refractive index of 1.93 at 546 nm
Hardness of 17 GPa
Elastic modulus of 190 GPa
Abstract
This paper reports optical and nanomechanical properties of seldom studied highly a-axis oriented AlN thin films for the first time. These films were deposited by reactive DC magnetron sputtering technique at an optimal target to substrate distance of 180 mm. Bragg-Brentano geometry X-ray and rocking curve (FWHM = 52 arcsec) studies confirmed the preferred orientation. Spectroscopic ellipsometry revealed that these films exhibit a refractive index of 1.93 at a wavelength of 546 nm. The hardness and elastic modulus of these films were 17 GPa and 190 GPa, respectively. The mechanical properties obtained here are much higher than the earlier reported and therefore can be useful as protective coating in thermo printing devices, piezoelectric films in bulk acoustic wave resonators.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAcoustic Wave Resonator Technologies · GaN-based semiconductor devices and materials · Metal and Thin Film Mechanics
