Patent Overlay Mapping: Visualizing Technological Distance
Luciano Kay, Nils Newman, Jan Youtie, Alan L. Porter, Ismael Rafols

TL;DR
This paper introduces a global patent overlay mapping technique that visualizes technological relationships and activities across categories, aiding strategic decision-making and revealing unexpected technological connections.
Contribution
It develops a novel patent overlay map method based on citing-to-cited relationships, providing insights beyond traditional IPC classifications.
Findings
Patent overlay maps visualize technological areas effectively.
Similar categories based on citations may belong to different IPC branches.
The method supports competitive intelligence and policy decisions.
Abstract
This paper presents a new global patent map that represents all technological categories, and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision-making. The global patent map is based on similarities in citing-to-cited relationships between categories of theInternational Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent dataset, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related efforts of other global patent maps. The paper overlays nanotechnology-related patenting activities of two companies and two different nanotechnology subfields on the global patent map. The exercise shows…
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Taxonomy
TopicsIntellectual Property and Patents · Economic and Technological Innovation
