The feasibility of near-field ODR beam-size monitoring at 23 GeV at FACET
A.H. Lumpkin (Fermilab), C.-Y. Yao (Argonne), M. Hogan (SLAC), P., Muggli (Southern California U.)

TL;DR
This paper evaluates the feasibility of using near-field optical diffraction radiation (ODR) imaging to measure 23 GeV beam sizes at FACET, showing promising sensitivity and highlighting polarization effects for future experiments.
Contribution
The study extends near-field ODR imaging to high-energy 23 GeV beams at FACET, demonstrating its potential for precise beam size monitoring.
Findings
Sensitivity at 10-20 μm sigma level confirmed
Polarization effects are significant
Feasibility for experimental planning established
Abstract
Extension of near-field optical diffraction radiation (ODR) imaging to the 23 GeV beams at the proposed FACET facility at SLAC has been evaluated. The beam-size sensitivity at the 10- to 20- \mu m sigma level based on a simple model will be reported. Polarization effects are also seen to be important and will be discussed. The comparisons to previous experimental results and the modeling results indicate sufficient feasibility for planning of the experiments in the coming year.
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Taxonomy
TopicsIntegrated Circuits and Semiconductor Failure Analysis · Near-Field Optical Microscopy · Advanced Optical Sensing Technologies
