Improved approach to Fowler-Nordheim plot analysis

TL;DR

This paper presents an improved method for Fowler-Nordheim plot analysis using a new intercept correction factor, enhancing accuracy and applicability for orthodox electron emission data analysis.

Contribution

It introduces a new intercept correction factor and a general theoretical framework for FN plot analysis applicable to a broad range of data fitting scenarios.

Findings

New intercept correction factor is more clearly defined.

Numerical methods enable quick evaluation of correction factors.

Simulated data demonstrates improved parameter extraction.

Abstract

This article introduces an improved approach to Fowler-Nordheim (FN) plot analysis, based on a new type of intercept correction factor. This factor is more cleanly defined than the factor previously used. General enabling theory is given that applies to any type of FN plot of data that can be fitted using a FN-type equation. Practical use is limited to emission situations where slope correction factors can be reliably predicted. By making a series of well-defined assumptions and approximations, it is shown how the general formulas reduce to provide an improved theory of orthodox FN-plot data analysis. This applies to situations where the circuit current is fully controlled by the emitter characteristics, and tunneling can be treated as taking place through a Schottky-Nordheim (SN) barrier. For orthodox emission, good working formulas make numerical evaluation of the slope correction factor and the new intercept correction factor quick and straightforward. A numerical illustration, using simulated emission data, shows how to use this improved approach to derive values for parameters in the full FN-type equation for the SN barrier. Good self-consistency is demonstrated. The general enabling formulas also pave the way for research aimed at developing analogous data-analysis procedures for non-orthodox emission situations.