Estimation of Young's Modulus of Graphene by Raman Spectroscopy
Jae-Ung Lee, Duhee Yoon, and Hyeonsik Cheong
TL;DR
This paper estimates the Young's modulus of graphene by correlating Raman spectroscopy peak shifts with applied strain on pressurized graphene membranes, providing precise measurements for single- and bi-layer graphene.
Contribution
It introduces a method combining Raman spectroscopy and numerical simulation to accurately determine graphene's Young's modulus.
Findings
Young's modulus of single-layer graphene is 2.4±0.4 TPa.
Young's modulus of bi-layer graphene is 2.0±0.5 TPa.
The method enables direct strain measurement from Raman peak shifts.
Abstract
The Young's modulus of graphene is estimated by measuring the strain applied by a pressure difference across graphene membranes using Raman spectroscopy. The strain induced on pressurized graphene balloons can be estimated directly from the peak shift of the Raman G band. By comparing the measured strain with numerical simulation, we obtained the Young's modulus of graphene. The estimated Young's modulus values of single- and bi-layer graphene are 2.4\pm0.4 TPa and 2.0\pm0.5 TPa, respectively.
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