Conditional limit laws for goodness-of-fit tests
Richard A. Lockhart

TL;DR
This paper investigates the asymptotic behavior of goodness-of-fit statistics in exponential family models, demonstrating their approximation by parametric bootstrap distributions and providing theoretical expansions for Rao-Blackwell estimates.
Contribution
It introduces a new understanding of the conditional distribution of goodness-of-fit tests, showing their closeness to bootstrap distributions in large samples, and derives uniform Edgeworth expansions for Rao-Blackwell estimates.
Findings
Conditional distribution approximates bootstrap distribution in large samples
Provides uniform Edgeworth expansions for Rao-Blackwell estimates
Enhances understanding of goodness-of-fit tests in exponential families
Abstract
We study the conditional distribution of goodness of fit statistics of the Cram\'{e}r--von Mises type given the complete sufficient statistics in testing for exponential family models. We show that this distribution is close, in large samples, to that given by parametric bootstrapping, namely, the unconditional distribution of the statistic under the value of the parameter given by the maximum likelihood estimate. As part of the proof, we give uniform Edgeworth expansions of Rao--Blackwell estimates in these models.
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