Sensitivity of Double-Sided Split Ring Resonator Arrays to Fabrication Tolerances

TL;DR

This paper investigates how fabrication tolerances affect the performance of double-sided split-ring resonator arrays, highlighting the sensitivity of resonant frequency to manufacturing errors through simulations and measurements.

Contribution

It provides a detailed analysis of fabrication tolerance effects on resonator array performance, including experimental validation and identification of dominant error sources.

Findings

Resonant frequency measured 6.3% higher than predicted

Sensitivity of frequency response to fabrication errors demonstrated

Dominant fabrication error identified and analyzed

Abstract

We present a study of the effects of fabrication tolerances on the performance of a planar array of double-sided split-ring resonators, printed on two sides of a dielectric substrate and fabricated using a printed circuit board (PCB) milling machine. The array is simulated and measured in an X-band waveguide, and the measured resonant frequency is found to be 6.3% higher than the predicted one. The sensitivity of the frequency response to several possible fabrication and measurement errors is investigated, and the dominant effect identified and demonstrated experimentally and in simulation.