Ageing and relaxation times in disordered insulators
Thierry Grenet (NEEL), Julien Delahaye (NEEL), M.C. Cheynet (SIMAP)

TL;DR
This paper investigates the aging and relaxation dynamics in disordered insulators, revealing how their conductance relaxations depend on system age and challenging traditional methods for measuring relaxation times.
Contribution
It introduces a new perspective on aging effects in disordered insulators and critiques the standard 'two dip' protocol for extracting characteristic relaxation times.
Findings
Relaxation times evolve with system age.
The 'two dip' protocol is ineffective for certain disordered systems.
Doping influences the glassy behavior of disordered insulators.
Abstract
We focus on the slow relaxations observed in the conductance of disordered insulators at low temperature (especially granular aluminum films). They manifest themselves as a temporal logarithmic decrease of the conductance after a quench from high temperatures and the concomitant appearance of a field effect anomaly centered on the gate voltage maintained. We are first interested in ageing effects, i.e. the age dependence of the dynamical properties of the system. We stress that the formation of a second field effect anomaly at a different gate voltage is not a "history free" logarithmic (lnt) process, but departs from lnt in a way which encodes the system's age. The apparent relaxation time distribution extracted from the observed relaxations is thus not "constant" but evolves with time. We discuss what defines the age of the system and what external perturbation out of equilibrium does…
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