Surface plasmons in metallic films of arbitrary thickness with mirror boundary conditions

TL;DR

This paper provides an analytic solution for surface plasmons in metallic films of any thickness with mirror boundary conditions, extending the approach to general conducting materials including semiconductors.

Contribution

It introduces an analytic solution for surface plasmons in metallic films of arbitrary thickness with mirror boundary conditions, applicable to various conducting materials.

Findings

Analytic solutions for surface plasmons in arbitrary thickness films.

Extension of the model to semiconductors and other conductors.

Potential for broader applications in plasmonics and material science.

Abstract

A metallic film of arbitrary thickness is considered. We show that the problem of description of surface plasma oscillations (surface plasmons) with reflection boundary conditions allows analytic solution. Besides, this problem allows generalization for more general case of conducting matter (in particular, and for semiconductors).