Extraction of the homogeneous linewidth of a fast spectrally diffusing line

TL;DR

This paper introduces a straightforward photon correlation method to determine the homogeneous linewidth of a single photon emitter affected by rapid spectral diffusion, enabling better understanding of spectral dynamics in quantum dots.

Contribution

The paper presents a novel, simple technique using photon correlation measurements to extract the homogeneous linewidth in the presence of fast spectral diffusion.

Findings

The method successfully measures homogeneous linewidths down to 1 ns spectral diffusion.

Spectral diffusion amplitude varies with temperature in CdSe/ZnSe quantum dots.

The technique reveals the relationship between spectral diffusion and homogeneous linewidth.

Abstract

We present a simple method to extract the homogeneous linewidth of a single photon emitter line exhibiting fast (down to 1 ns) spectral diffusion (SD). It is based on a recently developed technique using photon correlation measurements on half of the line. Here we show that the SD induced bunching depends on the ratio between the width of the homogeneous line and the spectral diffusion amplitude. Using this technique on a CdSe/ZnSe quantum dot, we investigate the temperature dependence of its fast SD amplitude and its homogeneous excitonic linewidth.