Mass-loading induced dephasing in nanomechanical resonators

TL;DR

This paper models how random mass loading affects the dephasing and spectral features of nanomechanical resonators, providing insights into particle dynamics and improving mass measurement techniques.

Contribution

It introduces a frequency noise model for mass loading effects, linking spectral features to particle attachment, detachment, and diffusion parameters.

Findings

Spectral broadening and fine structure depend on particle dynamics.

Higher order cumulants reveal information about particle diffusion and attachment rates.

Measurement of cumulants can enhance mass sensing accuracy.

Abstract

I study dephasing of an underdamped nanomechanical resonator subject to random mass loading of small particles. I present a frequency noise model which describes dephasing due to attachment and detachment of particles at random points and particle diffusion along the resonator. This situation is commonly encountered in current mass measurement experiments using NEM resonators. I discuss the conditions which can lead to inhomogeneous broadening and fine structure in the modes absorption spectra. I also show that the spectra of the higher order cumulants of the (complex) vibrational mode amplitude are sensitive to the parameters characterizing the frequency noise process. Hence, measurement of these cumulants can provide information not only about the mass but also about other parameters of the particles (diffusion coefficient and attachment-detachment rates.)