Structural study in Highly Compressed BiFeO3 Epitaxial Thin Films on YAlO3
Heng-Jui Liu, Hsiang-Jung Chen, Wen-I Liang, Chen-Wei Liang, Hsin-Yi, Lee, Su-Jien Lin, Ying-Hao Chu

TL;DR
This study investigates the structural phase transitions and strain effects in highly compressed BiFeO3 epitaxial thin films on YAlO3, revealing phase evolution, stability of tetragonal-like phases, and potential for strain engineering.
Contribution
It provides detailed insights into the phase transition process and strain-induced structural evolution in BiFeO3 thin films on YAlO3 substrates, highlighting the stability of T-like phases in thick films.
Findings
Identification of a phase transition sequence MC-MA-T in thin films.
Confirmation of a tetragonal-like phase with large c/a ratio.
Observation of phase coexistence and stripe morphology in thick films.
Abstract
We report a study on the thermodynamic stability and structure analysis of the epitaxial BiFeO3 (BFO) thin films grown on YAlO3 (YAO) substrate. First we observe a phase transition of MC-MA-T occurs in thin sample (<60 nm) with an utter tetragonal-like phase (denoted as MII here) with a large c/a ratio (~1.23). Specifically, MII phase transition process refers to the structural evolution from a monoclinic MC structure at room temperature to a monoclinic MA at higher temperature (150oC) and eventually to a presence of nearly tetragonal structure above 275oC. This phase transition is further confirmed by the piezoforce microscopy measurement, which shows the rotation of polarization axis during the phase transition. A systematic study on structural evolution with thickness to elucidate the impact of strain state is performed. We note that the YAO substrate can serve as a felicitous base…
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