Simultaneous Surface Plasmon Resonance and X-ray Absorption Spectroscopy

TL;DR

This paper introduces an experimental setup that enables simultaneous in situ measurements of surface plasmon resonance and X-ray absorption spectroscopy, allowing real-time analysis of their interactions and electronic changes in thin films.

Contribution

The novel setup combines SPR and XAS measurements in a synchrotron beamline, enabling simultaneous, in situ, real-time analysis of their effects on thin films.

Findings

Detection sensitivity ranges from 10^-3 to 10^-5.

Allows real-time monitoring of X-ray effects on SPR.

Enables concurrent recording of SPR and XAS spectra.

Abstract

We present here an experimental set-up to perform simultaneously measurements of surface plasmon resonance (SPR) and X-ray absorption spectroscopy (XAS) in a synchrotron beamline. The system allows measuring in situ and in real time the effect of X-ray irradiation on the SPR curves to explore the interaction of X-rays with matter. It is also possible to record XAS spectra while exciting SPR in order to detect the changes in the electronic configuration of thin films induced by the excitation of surface plasmons. Combined experiments recording simultaneously SPR and XAS curves while scanning different parameters can be carried out. The relative variations in the SPR and XAS spectra that can be detected with this set-up ranges from 10-3 to 10-5, depending on the particular experiment.