Stimulus and correlation matching measurement technique in computer based characterization testing

TL;DR

This paper introduces a correlation-based measurement technique for characterizing nano devices, using co-synthesis of stimulus and reference signals to improve detection amidst noise and background interference.

Contribution

It proposes a novel co-synthesis approach for stimulus and reference signals in correlation measurement, enhancing nano device characterization accuracy.

Findings

Effective in masking background and noise effects

Applicable to current-voltage and Auger current measurements

Improves sensitivity of nano device testing

Abstract

Constructive theory of characterization test is considered. The theory is applicable to a nano devices characterization: current-voltage, Auger current dependence. Generally small response of device under test on an applied stimulus is masked by an unknown deterministic background and a random noise. Characterization test in this signal corruption scenario should be based on correlation measurement technique of device response on applied optimal stimulus with optimal reference signal. Co-synthesis solution of stimulus and reference signal is proposed.