Zero-loss/deflection map analysis

TL;DR

This paper introduces a method using zero-loss/deflection maps in EFTEM to analyze object contrast, supported by experimental data and initial modeling, enhancing understanding of electron scattering behavior.

Contribution

It presents the first models for interpreting zero-loss/deflection map patterns in EFTEM, providing a new approach to analyze object contrast.

Findings

Zero-loss/deflection maps serve as a robust fingerprint of object contrast.

Experimental data supports the use of these maps for contrast analysis.

Initial models help interpret the patterns observed in the maps.

Abstract

Experimental plots of the fraction of detected electrons removed from the zero-loss peak, versus the fraction of incident electrons scattered outside of the objective aperture, can serve as a robust fingerprint of object-contrast in an energy filtered transmission electron microscope (EFTEM). Examples of this, along with the first in a series of models for interpreting the resulting patterns, were presented at the August 2010 meeting of the Microscope Society of America meeting in Portland, Oregon, and published in {\em Microscopy and MicroAnalysis} {\bf 16}, Supplement 2, pages 1534-1535 by Cambridge University Press.