Rule-based Test Generation with Mind Maps

TL;DR

This paper presents a rule-based test generation approach using mind maps, detailing its formalization, architecture, and industrial application in smart card testing to improve test coverage and efficiency.

Contribution

It introduces a novel rule-based test generation method utilizing mind maps, with formalized criteria and a framework demonstrated in industrial smart card testing.

Findings

Successful application in industrial smart card testing

Enhanced test coverage and efficiency

Framework adaptable to other domains

Abstract

This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.