Rule-based Test Generation with Mind Maps
Dimitry Polivaev (Giesecke, Devrient GmbH)

TL;DR
This paper presents a rule-based test generation approach using mind maps, detailing its formalization, architecture, and industrial application in smart card testing to improve test coverage and efficiency.
Contribution
It introduces a novel rule-based test generation method utilizing mind maps, with formalized criteria and a framework demonstrated in industrial smart card testing.
Findings
Successful application in industrial smart card testing
Enhanced test coverage and efficiency
Framework adaptable to other domains
Abstract
This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
