Conduction, diffusion and noise of electrons in amorphous chalcogenides at low electric fields
Fabrizio Buscemi, Enrico Piccinini, Rossella Brunetti, Massimo Rudan,, and Carlo Jacoboni

TL;DR
This study investigates low-field electron conduction, diffusion, and noise in amorphous chalcogenides using Monte Carlo simulations of three-dimensional variable-range hopping, revealing key features of linear-response behavior in Ge2Sb2Te5.
Contribution
It introduces a comprehensive Monte Carlo simulation approach for analyzing low-field electron transport and noise in amorphous chalcogenides, providing new insights into their linear-response regime.
Findings
Identification of carrier-velocity autocorrelation characteristics
Analysis of noise power spectrum in amorphous chalcogenides
Quantification of diffusion coefficient and ohmic conductivity
Abstract
The low-field electron diffusion, noise, and the conduction in amorphous chalcogenides are investigated by means of a Monte Carlo implementation of a full three- dimensional variable-range hopping transport model between localized states. Quantities like the carrier-velocity autocorrelation function, the noise power spectrum, the diffusion coefficient and the ohmic conductivity are obtained from numerical simulations at room temperatures and lower. Some interesting features of the linear-response regime typical of hopping transport are observed and discussed for the case of the amorphous Ge2Sb2Te5.
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Taxonomy
TopicsPhase-change materials and chalcogenides · Solid-state spectroscopy and crystallography · Chalcogenide Semiconductor Thin Films
