Automated characterization of single-photon avalanche photodiode
Aina M. M. Ghazali, Audun N. Bugge, Sebastien Sauge, Vadim Makarov
TL;DR
This paper presents an automated method for characterizing a silicon avalanche photodiode, measuring key parameters like I-V curves, dark count rate, and detection efficiency using a C++ routine.
Contribution
It introduces an automated characterization routine for single-photon detectors, streamlining measurements of critical parameters.
Findings
Automated routine successfully measures I-V curves at various illumination levels.
Dark count rate and detection efficiency are accurately characterized.
Implementation in C++ enables efficient and repeatable testing.
Abstract
We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 uW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer.
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