Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV)

TL;DR

This study calibrates phosphor imaging plates for XUV imaging in the 60 to 900 eV range, demonstrating their sensitivity and compatibility with silicon photodiodes, extending their known energy range.

Contribution

The paper provides the first calibration of phosphor imaging plates specifically for the 60 to 900 eV XUV energy range, expanding their application scope.

Findings

Sensitivity of ~25 counts/pJ across 60-900 eV

Calibration results consistent with previous measurements at 1 keV

Demonstrates compatibility with silicon photodiodes

Abstract

Phosphor imaging plates (IPs) have been calibrated and proven useful for quantitative x-ray imaging in the 1 to over 1000 keV energy range. In this paper we report on calibration measurements made at XUV energies in the 60 to 900 eV energy range using beamline 6.3.2 at the Advanced Light Source at Lawrence Berkeley National Laboratory. We measured a sensitivity of ~25 plus or minus 15 counts/pJ over the stated energy range which is compatible with the sensitivity of Si photodiodes that are used for time-resolved measurements. Our measurements at 900 eV are consistent with the measurements made by Meadowcroft et al. at ~1 keV.