Spin Hall transistor with electrical spin injection

TL;DR

This paper demonstrates a spin transistor device that combines electrical spin injection, manipulation, and detection via the inverse spin Hall effect in a 3D GaAs channel, advancing spin-based semiconductor technology.

Contribution

It integrates electrical spin injection, manipulation, and detection in a single device using a 3D GaAs channel with ultrathin Fe contacts, enabling comprehensive spin control and measurement.

Findings

Successful electrical spin injection from Fe contacts

Quantitative analysis of spin signals and Hall effects

Demonstration of spin manipulation via external magnetic fields

Abstract

The realization of a viable semiconductor transistor and information processing devices based on the electron spin has fueled intense basic research of three key elements: injection, detection, and manipulation of spins in the semiconductor channel. The inverse spin Hall effect (iSHE) detection of spins injected optically in a 2D GaAs and manipulated by a gate-voltage dependent internal spin-orbit field has recently led to the experimental demonstration of a spin transistor logic device. The aim of the work presented here is to demonstrate in one device the iSHE detection combined with an electrical spin injection and manipulation. We use a 3D GaAs channel for which efficient electrical spin injection from Fe Schottky contacts has been demonstrated in previous works. In order to experimentally separate the strong ordinary Hall effect signal from the iSHE in the semiconductor channel we developed epitaxial ultrathin-Fe/GaAs contacts allowing for Hanle spin-precession measurements in applied in-plane magnetic fields. Electrical injection and detection is combined in our transistor structure with electrically manipulated spin distribution and spin current which, unlike the previously utilized electrical manipulations of the spin-orbit field or ballistic spin transit time, is well suited for the diffusive 3D GaAs spin channel. The magnitudes and external field dependencies of the measured signals are quantitatively analyzed using simultaneous spin detection by the non-local spin valve effect and modeled by solving the drift-diffusion and Hall-cross response equations for the parameters of the studied microstructure.