Scanning microscopies of superconductors at very low temperatures
V. Crespo, A. Maldonado, J. A. Galvis, P. Kulkarni, I. Guillamon, J., G. Rodrigo, H. Suderow, S. Vieira, S. Banerjee, P. Rodiere

TL;DR
This paper reviews scanning tunneling microscopy/spectroscopy techniques for superconductors at very low temperatures, introduces a new method called SAS for local Andreev reflection measurement, and discusses vortex imaging under magnetic fields.
Contribution
It introduces Scanning Andreev Reflection Spectroscopy (SAS), a novel technique for local Andreev reflection analysis in superconductors.
Findings
Demonstrates the SAS method for local spectroscopic measurements.
Shows vortex lattice imaging as a function of magnetic field angle.
Discusses the application of STM/S in superconducting state analysis.
Abstract
We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample's surface.
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