Persistence of Covalent Bonding in Liquid Silicon Probed by Inelastic X-ray Scattering
J. T. Okada, P. H.-L. Sit, Y. Watanabe, Y. J. Wang, B. Barbiellini, T., Ishikawa, M. Itou, Y. Sakurai, A. Bansil, R. Ishikawa, M. Hamaishi, T., Masaki, P.-F. Paradis, K. Kimura, T. Ishikawa, and S. Nanao

TL;DR
This study uses inelastic x-ray scattering to demonstrate that covalent bonds persist in liquid silicon at high temperature, supporting the existence of a liquid-liquid phase transition, with covalent bonding estimated at 17%.
Contribution
It provides experimental evidence of covalent bonding in liquid silicon and supports the theoretical prediction of a liquid-liquid phase transition.
Findings
Persistence of covalent bonds in liquid silicon.
Agreement between experiments and molecular dynamics simulations.
Evidence supporting a liquid-liquid phase transition.
Abstract
Metallic liquid silicon at 1787K is investigated using x-ray Compton scattering. An excellent agreement is found between the measurements and the corresponding Car-Parrinello molecular dynamics simulations. Our results show persistence of covalent bonding in liquid silicon and provide support for the occurrence of theoretically predicted liquid-liquid phase transition in supercooled liquid states. The population of covalent bond pairs in liquid silicon is estimated to be 17% via a maximally-localized Wannier function analysis. Compton scattering is shown to be a sensitive probe of bonding effects in the liquid state.
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