First-Order Reorientation of the Flux-Line Lattice in CaAlSi

TL;DR

This study investigates the flux-line lattice in CaAlSi using neutron scattering, revealing a low-field reorientation transition likely of first-order, and characterizes the magnetic penetration depth and coherence length at low temperatures.

Contribution

It reports the first observation of a low-field flux-line lattice reorientation in CaAlSi and provides detailed measurements of penetration depth and coherence length.

Findings

Hexagonal flux line lattice observed just above Hc1 at 54 Oe.

A 30-degree reorientation occurs at 200 Oe, likely first-order.

Field dependence of form factor characterized by specific penetration depth and coherence length.

Abstract

The flux line lattice in CaAlSi has been studied by small angle neutron scattering. A well defined hexagonal flux line lattice is seen just above Hc1 in an applied field of only 54 Oe. A 30 degree reorientation of this vortex lattice has been observed in a very low field of 200 Oe. This reorientation transition appears to be of first-order and could be explained by non-local effects. The magnetic field dependence of the form factor is well described by a single penetration depth of 1496(1) angstroms and a single coherence length of 307(1) angstroms at 2 K. At 1.5 K the penetration depth anisotropy is 2.7(1) with the field applied perpendicular to the c axis and agrees with the coherence length anisotropy determined from critical field measurements.