Transition of Impurity Nanorod Orientation in Epitaxial YBCO Films on Vicinal Substrates

TL;DR

This theoretical study investigates how the orientation of impurity nanorods in epitaxial YBCO films on vicinal substrates changes with substrate angle, highlighting the role of interface coherence in this transition.

Contribution

It introduces a model predicting nanorod orientation transition based on interface coherence and substrate vicinal angle, aligning well with experimental data.

Findings

Transition from normal to in-plane nanorod orientation with increasing vicinal angle

Threshold angle for transition matches experimental observations

Strain field changes drive the nanorod orientation shift

Abstract

A theoretical study of the structural transition of impurity nanorod array in epitaxial YBCO films on vicinal STO substrates is presented. Two possible types of film/substrate interface were considered with one assuming a complete coherence while the other, defective as manifested in presence of anti-phase grain boundaries. Only in the former case, the increase of the vicinal angle of the substrate leads to a substantial change of the strain field in the film, resulting in a transition of the nanorod orientation from the normal to in-plane direction of the film. The calculation of the threshold vicinal angle for the onset of the transition and the lattice deformation of the film due to the inclusion of the impurity nanorods is in very good agreement with experimental observations.