Measurement of cluster elongation and charge in a pixel detector of 10~$\mu$m pitch at sub-GeV energies
M. Adamus, J. Ciborowski, L. Maczewski, P. Luzniak

TL;DR
This paper reports on measurements of cluster elongation and charge in a 10 μm pixel pitch MAPS detector using electron beams from 15 to 500 MeV, revealing energy-dependent behaviors at large incident angles.
Contribution
It provides the first detailed analysis of how cluster elongation and charge vary with energy and incident angle in a high-resolution pixel detector.
Findings
Cluster charge depends on electron energy.
Cluster elongation varies with incident angle.
Energy dependence observed at large angles.
Abstract
We present measurements of elongation and cluster charge using MIMOSA-18 MAPS pixel matrix with 10 m pixel pitch, using electron test beams of energies ranging from 15 to 500 MeV. We observe energy dependence of cluster charge and elongation for large incident angles.
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Particle Detector Development and Performance · Photocathodes and Microchannel Plates
