Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection

TL;DR

This paper presents a non-imaging speckle interferometry method for high-speed nanometer-scale position detection of complex scattering materials, using wave front control and optical fingerprints to achieve precise, rapid measurements without imaging.

Contribution

The authors introduce a novel non-imaging technique that uses wave front shaping and optical fingerprints for fast, high-resolution displacement sensing in scattering media.

Findings

Achieved 2.1 nm displacement resolution.

Enabled high-speed position detection with non-imaging detectors.

Demonstrated precise one-dimensional displacement measurement.

Abstract

We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a focus on a designated position. This wave front acts as an unique optical fingerprint that enables precise position detection of the illuminated material by simply measuring the intensity in the focus. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2.1 nm. As our approach does not require an image of the scattered field, it is possible to employ fast non-imaging detectors to enable high-speed position detection of scattering materials.